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Submit a ProposalBinary Decision Diagrams and Extensions for Systems Reliability Analysis
 | By Liudong Xing and Suprasad Amari Series: Performability Engineering Series Copyright: 2015 | Status: Published ISBN: 9781118549377 | Hardcover | 220 pages Price: $175.00 USD  |
One Line Description
The very first book that provides detailed coverage of binary decision diagrams and their extensions in solving complex reliability problems in an efficient and exact manner.
Audience
The core interest groups are research scientists and engineers (e.g. reliability engineering, electrical engineering, mechanical engineering, power engineering, nuclear engineering, computer scientists) working on algorithms and data structures. The book will also be very valuable to those working in companies that purchase reliability, safety, and dependability standards including IEC standards, SAE standards, ISO standards, MIL standards, and aerospace standards. The book can also be used as a textbook on system reliability analysis courses at the graduate and undergraduate levels.
The core interest groups are research scientists and engineers (e.g. reliability engineering, electrical engineering, mechanical engineering, power engineering, nuclear engineering, computer scientists) working on algorithms and data structures. The book will also be very valuable to those working in companies that purchase reliability, safety, and dependability standards including IEC standards, SAE standards, ISO standards, MIL standards, and aerospace standards. The book can also be used as a textbook on system reliability analysis courses at the graduate and undergraduate levels.
Description
Recent advances in science and technology have made modern computing and engineering systems more powerful and sophisticated than ever. The increasing complexity and scale imply that system reliability problems not only continue to be a challenge but also require more efficient models and solutions. This is the first book systematically covering the state-of-the-art binary decision diagrams and their extended models, which can provide efficient and exact solutions to reliability analysis of large and complex systems.
The book provides both basic concepts and detailed algorithms for modeling and evaluating reliability of a wide range of complex systems, such as multi-state systems, phased-mission systems, fault-tolerant systems with imperfect fault coverage, systems with common-cause failures, systems with disjoint failures, and systems with functional dependent failures. These types of systems abound in safety-critical or mission-critical applications such as aerospace, circuits, power systems, medical systems, telecommunication systems, transmission systems, traffic light systems, data storage systems, etc.
The book provides both small-scale illustrative examples and large-scale benchmark examples to demonstrate broad applications and advantages of different decision diagrams based methods for complex system reliability analysis. Other measures including component importance and failure frequency are also covered. A rich set of references is cited in the book, providing helpful resources for readers to pursue further research and study of the topics.
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Recent advances in science and technology have made modern computing and engineering systems more powerful and sophisticated than ever. The increasing complexity and scale imply that system reliability problems not only continue to be a challenge but also require more efficient models and solutions. This is the first book systematically covering the state-of-the-art binary decision diagrams and their extended models, which can provide efficient and exact solutions to reliability analysis of large and complex systems.
The book provides both basic concepts and detailed algorithms for modeling and evaluating reliability of a wide range of complex systems, such as multi-state systems, phased-mission systems, fault-tolerant systems with imperfect fault coverage, systems with common-cause failures, systems with disjoint failures, and systems with functional dependent failures. These types of systems abound in safety-critical or mission-critical applications such as aerospace, circuits, power systems, medical systems, telecommunication systems, transmission systems, traffic light systems, data storage systems, etc.
The book provides both small-scale illustrative examples and large-scale benchmark examples to demonstrate broad applications and advantages of different decision diagrams based methods for complex system reliability analysis. Other measures including component importance and failure frequency are also covered. A rich set of references is cited in the book, providing helpful resources for readers to pursue further research and study of the topics.
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Author / Editor Details
Liudong Xing is a professor in the Department of Electrical and Computer Engineering at the University of Massachusetts (UMass), Dartmouth. She received her PhD degree in Electrical Engineering from the University of Virginia, Charlottesville in 2002 and has authored or co-authored more than 200 technical papers. She is the recipient of the Leo M. Sullivan Teacher of the Year Award (2014), Scholar of the Year Award (2010), Outstanding Women Award (2011) of UMass Dartmouth, as well as the IEEE Region 1 Technological Innovation (Academic) Award (2007).
Liudong Xing is a professor in the Department of Electrical and Computer Engineering at the University of Massachusetts (UMass), Dartmouth. She received her PhD degree in Electrical Engineering from the University of Virginia, Charlottesville in 2002 and has authored or co-authored more than 200 technical papers. She is the recipient of the Leo M. Sullivan Teacher of the Year Award (2014), Scholar of the Year Award (2010), Outstanding Women Award (2011) of UMass Dartmouth, as well as the IEEE Region 1 Technological Innovation (Academic) Award (2007).
Suprasad V. Amari received the MS and PhD degrees in Reliability Engineering from the Indian Institute of Technology, Kharagpur, India. He is a senior technical staff member at Relyence Corporation. Prior to joining Relyence, he served as a Technical Fellow at Parametric Technology Corporation (PTC) for 14 years, where he was responsible for research, design, and development of PTC’s reliability modeling and analysis software products. He has authored or co-authored 6 book chapters in handbooks and about 90 technical papers in the area of reliability engineering. He has been actively involved with the Annual Reliability and Maintainability Symposium (RAMS) and currently serves as the Vice General Chair.
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