-
Browse Book Series
- Adhesion and Adhesives: Fundamental and Applied Aspects
- Advances in Additive Manufacturing Technologies
- Advances in Antenna, Microwave and Communication Engineering
- Advances in Biofeedstocks and Biofuels
- Advances in Cyber Security
- Advances in Data Engineering and Machine Learning
- Advances in E-Mobility
- Advances in Hydrogen Production and Storage
- Advances in Intelligent and Scientific Computing (AISC)
- Advances in Learning Analytics for Intelligent Cloud-IoT Systems
- Advances in Membrane Processes
- Advances in Nanotechnology and Applications
- Advances in Natural Gas Engineering
- Advances in Pipes and Pipelines
- Advances in Production Engineering
- Advances in Solar Cell Materials and Storage
- Applied Functional Materials
- Artificial Intelligence and Soft Computing for Industrial Transformation
- Astrobiology Perspectives on Life in the Universe
- Bioprocessing in Food Science
- Computational Intelligence and Biomedical Engineering
- Concise Introductions to AI and Data Science
- Cyber Systems and Quantum Engineering
- Decentralized Systems and Next-Generation Internet
- Diatoms: Biology and Applications
- Digital Convergence in Engineering Systems
- Emerging Trends in Medicinal and Pharmaceutical Chemistry
- Engineering Systems Design for Sustainable Development
- Fintech in a Sustainable Digital Society
- Industry 5.0 Transformation Applications
- Infectious and Rare Diseases
- Innovations in Materials and Manufacturing
- Machine Learning in Biomedical Science and Healthcare Informatics
- Materials Degradation and Failure
- Mathematics and Computer Science
- Next-Generation Computing and Communication Engineering
- Performability Engineering Series
- Rotating Machinery Fundamentals and Advances
- Studies in Computational Intelligence and Smart Technologies
- Sustainable Computing and Optimization
Browse Subject Areas
For Authors
Submit a ProposalImmittance Spectroscopy
 | Applications to Material Systems By Mohammad Alim Copyright: 2017 | Status: Published ISBN: 9781119184850 | Hardcover | 424 pages | 165 illustrations Price: $195 USD  |
One Line Description
Written by one of the pioneers of Immittance Spectroscopy, the book covers precise definition, theory, and applications of overall immittance spectroscopy reflecting the meaning and scope of the spectroscopic style analysis of the data.
Audience
This book is designed for scientists and engineers, graduate and post-graduate students in the disciplines of solid state physics, chemistry, electrochemistry, biology and biological sciences, bioengineering and biotechnology, materials science and engineering, electrical engineering, mechanical engineering, civil engineering, chemical engineering, metallurgy, corrosion science, reliability engineering, quality control.
This book is designed for scientists and engineers, graduate and post-graduate students in the disciplines of solid state physics, chemistry, electrochemistry, biology and biological sciences, bioengineering and biotechnology, materials science and engineering, electrical engineering, mechanical engineering, civil engineering, chemical engineering, metallurgy, corrosion science, reliability engineering, quality control.
Description
This book emphasizes the use of four complex plane formalisms (impedance, admittance, complex capacitance, and modulus) in a simultaneous fashion. The purpose of employing these complex planes for handling semicircular relaxation using a single set of measured impedance data (ac small-signal electrical data) is underscored. The current literature demonstrates the importance of template version of impedance plot whereas this book reflects the advantage of using concurrent four complex plane plots for the same data. This approach allows extraction of a meaningful equivalent circuit model attributing to possible interpretations via potential polarizations and operative mechanisms for the investigated material system. Thus, this book supersedes the limitations of the impedance plot, and intends to serve a broader community of scientific and technical professionals better for their solid and liquid systems.
This unique book addresses the following:
• Lumped Parameter/Complex Plane Analysis (LP/CPA) in conjunction with the Bode plots
• Equivalent circuit model (ECM) derived from the LP/CPA
• Underlying Operative Mechanisms along with the possible interpretations
• Ideal (Debye) and non-ideal (non-Debye) relaxations
• Data-Handling Criteria (DHC) using Complex Nonlinear Least Squares (CNLS) fitting procedures.
Back to Top
This book emphasizes the use of four complex plane formalisms (impedance, admittance, complex capacitance, and modulus) in a simultaneous fashion. The purpose of employing these complex planes for handling semicircular relaxation using a single set of measured impedance data (ac small-signal electrical data) is underscored. The current literature demonstrates the importance of template version of impedance plot whereas this book reflects the advantage of using concurrent four complex plane plots for the same data. This approach allows extraction of a meaningful equivalent circuit model attributing to possible interpretations via potential polarizations and operative mechanisms for the investigated material system. Thus, this book supersedes the limitations of the impedance plot, and intends to serve a broader community of scientific and technical professionals better for their solid and liquid systems.
This unique book addresses the following:
• Lumped Parameter/Complex Plane Analysis (LP/CPA) in conjunction with the Bode plots
• Equivalent circuit model (ECM) derived from the LP/CPA
• Underlying Operative Mechanisms along with the possible interpretations
• Ideal (Debye) and non-ideal (non-Debye) relaxations
• Data-Handling Criteria (DHC) using Complex Nonlinear Least Squares (CNLS) fitting procedures.
Back to Top
Author / Editor Details
Mohammad A. Alim is a Professor in the Department of Electrical Engineering & Computer Science at Alabama A & M University (AAMU) where he joined as one of the founding faculty members in August 1998. He earned MS in Physics and PhD in Electrical Engineering & Computer Science from Marquette University in 1980 and 1986, respectively. He is the singlehanded pioneering developer of the concurrent multiple complex plane analysis of the measured ac small-signal electrical data. The achievement of the frequency-independent dielectric behavior for the polycrystalline varistors was a milestone and has been highly cited for a variety of complicated material systems. Most recently Dr. Alim has been instrumental in developing collaboratively MATLAB based CNLS curve fitting. His long time exposure in experiments with the state-of-the-art instruments and knowledge in supervision and maintenance is the asset for the semiconductor measurements and reverse engineering curricula. He possesses 100+ publications comprising of co-edited books, book chapters, NASA Technical Memorandum, peer-reviewed journal papers, U.S. patents, and conference proceedings/abstracts, etc. beside international seminars.
Mohammad A. Alim is a Professor in the Department of Electrical Engineering & Computer Science at Alabama A & M University (AAMU) where he joined as one of the founding faculty members in August 1998. He earned MS in Physics and PhD in Electrical Engineering & Computer Science from Marquette University in 1980 and 1986, respectively. He is the singlehanded pioneering developer of the concurrent multiple complex plane analysis of the measured ac small-signal electrical data. The achievement of the frequency-independent dielectric behavior for the polycrystalline varistors was a milestone and has been highly cited for a variety of complicated material systems. Most recently Dr. Alim has been instrumental in developing collaboratively MATLAB based CNLS curve fitting. His long time exposure in experiments with the state-of-the-art instruments and knowledge in supervision and maintenance is the asset for the semiconductor measurements and reverse engineering curricula. He possesses 100+ publications comprising of co-edited books, book chapters, NASA Technical Memorandum, peer-reviewed journal papers, U.S. patents, and conference proceedings/abstracts, etc. beside international seminars.
Back to Top